Home » Micro-electronics & Nanotechnology, Picture Gallery » Cascade Microtech COMPASS 2013 User Conference Announces Call for Papers

Cascade Microtech COMPASS 2013 User Conference Announces Call for Papers




BEAVERTON, OR — (Marketwired) — 06/26/13 — Cascade Microtech, Inc. (NASDAQ: CSCD), a leader at enabling precision measurements of integrated circuits at the wafer level, today announced the call for papers for its first annual user conference, COMPASS. The Conference will provide Cascade Microtech users with best practices, tools and techniques to increase productivity across wafer probing applications. The Conference will address important issues in various use cases to include device characterization and modeling, reliability, and manufacturing test. The full-day event is being held on September 9, 2013 at the Hyatt Regency Orange County in Anaheim, CA.

“COMPASS is a part of Cascade Microtech-s new -CONNECT- initiative, which we are developing in conjunction with our customers and partners who share a desire to stay ahead of technology,” said Debbora Ahlgren, Vice President of Marketing. “We believe the accumulated knowledge of our industry peers drives discovery and innovation, and that we can facilitate that exchange with our customers.”

COMPASS will give users the opportunity to share ideas and solutions with fellow attendees who utilize a wide spectrum of process technologies. Topics will focus on industry-wide challenges and emerging technology requirements. Attendees will learn about the newest probe solutions for device characterization and modeling, as well as solutions for enabling high-volume test, while networking with technical experts from Cascade Microtech as well as the company-s customers and partners.

Abstracts are now being accepted for 40-minute presentations for technology tracks covering:

RF calibration: trends, theory, techniques

Data correlation between engineering development and production test

3D TSV characterization and package test at high volumes

Reliability techniques including electromigration

Probing small geometries – procedures, best practices, solutions

High-temperature process challenges

Automation vs. accuracy – considerations and trade-offs

To respond to the call for papers, send an email with your name, presentation title, and a 200-word abstract to .

Cascade Microtech, Inc. (NASDAQ: CSCD) is a worldwide leader in precision contact, electrical measurement and test of integrated circuits (ICs), optical devices and other small structures. For technology businesses and scientific institutions that need to evaluate small structures, Cascade Microtech delivers access to electrical data from wafers, ICs, IC packages, circuit boards and modules, MEMS, 3D TSV, LED devices and more. Cascade Microtech-s leading-edge stations, probes, probe cards and integrated systems deliver precision accuracy and superior performance both in the lab and during production manufacturing of high-speed and high-density semiconductor chips. For more information visit .

FOR MORE INFORMATION, CONTACT:

Debbora Ahlgren
Cascade Microtech, Inc.
(503) 601-1934





Posted by on 26. June 2013. Filed under Micro-electronics & Nanotechnology, Picture Gallery. You can follow any responses to this entry through the RSS 2.0. You can leave a response or trackback to this entry

Leave a Reply

Archive

© 2017 So-Co-IT. All Rights Reserved. Log in - Copyright by LayerMedia


Blogverzeichnis - Blog Verzeichnis bloggerei.de Blog Top Liste - by TopBlogs.de Bloggeramt.de blogoscoop