BEAVERTON, OR — (Marketwire) — 10/10/11 — Cascade Microtech, Inc. (NASDAQ: CSCD), a leading expert at enabling precision measurements of integrated circuits at the wafer level, today announced InfinityQuad, the only multi-contact probe head capable of automatically probing aluminum, copper or gold pads as small as 30 µm x 50 µm. The InfinityQuad probe builds on the proven Cascade Microtech Infinity Probe® technology to address cutting-edge mixed-signal device manufacturing requirements in emerging markets such as automotive radar and wireless HDMI.
Analog automotive application-specific devices lead the growth segments in the IC industry, according to a recent report by IC Insights stating systems and features such as GPS/Navigation, anti-roll, and collision-avoidance/adaptive cruise control are expected to help this segment achieve 32 percent growth in 2011. The high-frequency devices found in today-s collision-avoidance radar and wireless HDMI are made up of complex mixed-signal integrated circuits containing RF, DC and logic with frequencies of 60-80 GHz. Up until now, it has been difficult to probe these frequencies on very small pads and deliver accurate measurements.
The new InfinityQuad probe uses a unique lithographically-defined probe architecture to probe small pads and enable high-frequency test. This probe technology enables customization of up to 25 contacts for ground, power, logic, RF or mm-wave contacts to 110 GHz, and enables probing of 30 µm x 50 µm pads at fine pitches over a temperature range of -40 to +125 degrees C with minimal pad damage. The InfinityQuad delivers repeatable, accurate measurement of ICs, transistor or device arrays and test structures with low contact resistance on aluminum, copper or gold pads. The InfinityQuad probe is the only probe technology that allows automated testing of automotive radar and other advanced devices with multiple mm-wave signals as well as many lower frequency signals, power and control lines.
“The unique design of the InfinityQuad allows our customers to stay ahead of the technology curve for testing complex device geometries,” said Michael Burger, president and CEO, Cascade Microtech, Inc. “As the market moves to smaller and smaller footprints for high-frequency test, precision measurement becomes critical. Cascade Microtech is pleased to offer our customers a truly innovative, high-performance multi-contact probe solution to meet the challenges of device test today and in the future.”
Cascade Microtech, Inc. (NASDAQ: CSCD) is a worldwide leader in precision contact, electrical measurement and test of integrated circuits (ICs), optical devices and other small structures. For technology businesses and scientific institutions that need to evaluate small structures, Cascade Microtech delivers access to electrical data from wafers, ICs, IC packages, circuit boards and modules, MEMS, 3D TSV, LED devices and more. Cascade Microtech-s leading-edge stations, probes, probe cards and integrated systems deliver precision accuracy and superior performance both in the lab and during production manufacturing of high-speed and high-density semiconductor chips. For more information visit .
FOR MORE INFORMATION, CONTACT:
Laurie A. Winton
Cascade Microtech, Inc.
(503) 601-1934
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