Home » Electronics & Semiconductors » imec and Park Systems sign the 2nd JDP to Increase the Strategic Investment in Developing Nano-Metrology Solutions for Semiconductor Manufacturing

imec and Park Systems sign the 2nd JDP to Increase the Strategic Investment in Developing Nano-Metrology Solutions for Semiconductor Manufacturing




Park Systems, the global leader and innovator of Atomic Force Microscopy and Metrology solutions, and imec, world-leading R&D and innovation hub in nanoelectronics and digital technologies, have signed the 2nd Joint Development Project (JDP) within 4 years to increase the development efforts for future generation in-line AFM metrology solutions. The official signing ceremony has taken place last Monday, February 17, 2020, at imec?s headquarters in Leuven, Belgium.

The new JDP extends the collaboration to explore new frontiers of AFM metrology solutions for the wafer semiconductor sector. As enhanced possibilities of inline automated AFM in semiconductor research, such as surface roughness, critical dimension (CD) and sidewall roughness, have been successfully explored in the first JDP, the second JDP targets multiple strategic developments to address the current metrological challenges of continuously downscaling the geometrical dimensions of devices and 3D assembly stacking.

?Collaboration with leading research centers such as imec is crucial for us to deliver the best technological solutions addressing the needs of research and industrial markets. I am very glad to partner with imec on this mission again, and I look forward to a fruitful further cooperation,? commented Dr. Sang-il Park, the CEO of Park Systems.

??Park Systems has grown a lot in the past years, which is definitely helpful also for our joint development efforts with Park.? The new joint development project that we have just signed showcases the best and beautiful collaboration we have together,? added Kristof Paredis, R&D Manager from imec.

After signing the first JDP in 2015 Park Systems officially joined imec?s Industrial Affiliation Program (IIAP) and became a member of IIAP. Ever since then, the interdisciplinary team of Park?s and imec?s researchers and engineers follow the goal to develop new protocols designed to increase production yield and device performance for the semiconductor industry. With a strong focus on practical problem-solving applications of the new JDP, the partners aim to deliver innovative 3D-Metrology features for market challenges of ever smaller semiconductor devices.

Park Systems, the leading manufacturer of Atomic Force Microscopy (AFM), enables researchers and engineers around the globe to contribute to impactful science and technological development that helps humanity to grow and improve life standards.

Thanks to the high-level technological know-how and 100% commitment, the professionals at Park provide innovative application solutions for material and life science disciplines, to and with their customers.

With Park\-\-s high-performance scientific instruments for research and industrial communities we help to explore new phenomena in chemistry, materials, physics, life sciences, semiconductor and data storage industries. Cutting-edge AFM automation and the highest data accuracy enables to become more efficient, more accurate and more productive at your work.

Visit http://www.parksystems.com for more information.





Posted by on 23. March 2020. Filed under Electronics & Semiconductors. You can follow any responses to this entry through the RSS 2.0. You can leave a response or trackback to this entry

Leave a Reply

Archive

© 2020 So-Co-IT. All Rights Reserved. Log in - Copyright by LayerMedia


Blogverzeichnis - Blog Verzeichnis bloggerei.de Blog Top Liste - by TopBlogs.de Bloggeramt.de