Home » Electronics & Semiconductors » Park Systems Introduces Park NX-Tip Scan Head – The Automated Atomic Force Microscopy System for measuring Ultra Large and Heavy Flat Panel Displays

Park Systems Introduces Park NX-Tip Scan Head – The Automated Atomic Force Microscopy System for measuring Ultra Large and Heavy Flat Panel Displays




To answer the increasing demand for AFM based metrology on larger flat panel displays, Park Systems has introduced the NX-Tip Scan Head, which overcomes nanometrology challenges for sample dimensions over 300mm and weights above 1kg. The Tip Scanning Head (TSH) is a moving tip head designed specifically for automated AFM measurements and analyses on large samples such as OLED and LCD screens.

The automated TSH combines the x, y, and z scanners, and is mounted on a gantry style air bearing stage that allows movement directly to any point on the substrate. This innovative technological solution produces high resolution and accurate images of roughness, step height, critical dimension and sidewall measurements, thereby addressing the metrological needs for the development of large flat panel displays up to 65?, 75? and even larger sizes.

?Park NX-TSH was developed specifically for manufacturers setting up fabs to produce next-generation flat panel displays with the objective to overcome the 300mm size threshold limit,? states Keibock Lee, Park Systems Inc. ?Using conductive AFM, Park NX-TSH measures the sample surface with an optional probe station that contacts the sample surface and provides current into small devices or?chips.?

?Park Systems has scaled up their AFM tools for Gen10+ and all large flat panel displays?using Park NX-TSH (Tip Scanning Head) system, and is the only automated Tip Scan Head for large?sample analysis over 300 mm,? adds Lee.

Atomic force microscopy is the most accurate and non-destructive method of measuring samples at the Nanoscale. With the Park NX-TSH, reliable, high resolution AFM images can be obtained on OLEDs, LCDs, photomasks, and more, using a gantry style bridge system to improve productivity and quality.

Park Systems, the leading manufacturing of Atomic Force Microscopy (AFM), enables researchers and engineers around the globe to contribute to impactful science and technological development that helps humanity to grow and improve life standards.

Thanks to the high-level technological know-how and 100% commitment, the professionals at Park provide innovative application solutions for material and life science disciplines, to and with their customers.

With Park?s high-performance scientific instruments for research and industrial communities we help to explore new phenomena in chemistry, materials, physics, life sciences, semiconductor and data storage industries. Cutting-edge AFM automation and the highest data accuracy enables to become more efficient, more accurate and more productive at your work.

Visit http://www.parksystems.com for more information.





Posted by on 3. August 2020. Filed under Electronics & Semiconductors. You can follow any responses to this entry through the RSS 2.0. You can leave a response or trackback to this entry

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