Home » Micro-electronics & Nanotechnology, Picture Gallery » Advantest to Exhibit Wide Range of Semiconductor Test Solutions for the Internet of Things (IoT) at SEMICON West, July 14-16 in San Francisco

Advantest to Exhibit Wide Range of Semiconductor Test Solutions for the Internet of Things (IoT) at SEMICON West, July 14-16 in San Francisco

SAN JOSE, CA — (Marketwired) — 07/07/15 — Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) will showcase its full range of test solutions designed to enable the Internet of Things (IoT) including automatic test equipment (ATE), terahertz measurement systems, multi-vision scanning-electron microscopes (SEM) and an e-beam lithography system at the SEMICON West 2015 trade show, coming July 14-16 to Moscone Center in San Francisco.

Advantest will feature the debut of two new products: the T5833 system, capable of wafer sort and final test of virtually any NAND Flash or DRAM devices, and the T2000 28G OPM, the company–s first module designed for testing high-speed optical transceivers used in sending and receiving data through optical fibers. Other booth displays will highlight the versatile platform–s capabilities in improving time to quality (TTQ) in multi-site radio-frequency (RF) applications and testing IoT devices; the and test handlers for system-on-chip (SoC) and memory ICs; the for at-speed testing of fast CMOS image sensors; the T2000 IPS for integrated power device test solutions; and the for testing high-speed, high-pin-count display driver ICs (DDI). For advanced metrology and nano-patterning applications, the booth will include exhibits on Advantest–s terahertz measurement systems, used in non-destructive inspection of IC mold thickness and electrical fault analysis TDR; the company–s line of , and SEMs for inspecting next-generation wafers, photomasks and blanks; and the e-beam lithography tool for nano-processing challenges at the 10-nm technology node and below.

Also showcased in the exhibit will be demonstrations of an for digital and analog testing of small-pin-count semiconductors; Advantest–s CloudTesting Service; and SmartBox — an innovative, production and point-of-sale diagnostic test solution for smart phones, tablets and IoT devices. SmartBox was developed by W2BI, Inc., a member of the Advantest Group of companies.

In addition, technical authors from Advantest and a partner company are nominated for the Best ATE Paper of 2014, an industry honor to be presented during SEMICON West 2015 at the event. The paper titled “An ATE-Based 32-Gbaud PAM-4 At-Speed Characterization and Testing Solution” was originally presented at last November–s IEEE Asian Test Symposium in Hangzhou, China.

For the latest developments from Advantest, follow the company on Twitter @Advantest_ATE.

A world-class technology company, Advantest is a leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available at .

Judy Davies
VP of Global Marketing Communications
+1 408-456-3717

Posted by on 7. July 2015. Filed under Micro-electronics & Nanotechnology, Picture Gallery. You can follow any responses to this entry through the RSS 2.0. You can leave a response or trackback to this entry

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