Advantest Introduces New T2000 3Gbps CMOS Image Capture Module for Industry-Leading T2000 ISS Semiconductor Test Platform
High-Speed Image Capturing and Highly Parallel Testing Help to Reduce Production Costs for CMOS Image Sensing Devices
High-Speed Image Capturing and Highly Parallel Testing Help to Reduce Production Costs for CMOS Image Sensing Devices

Versatile New Test Instrument Reduces Costs and Speeds Time to Market for New ICs
Company-s Universal Pin Architecture Enables Massively Parallel Testing in a Single System

Consolidates Silicon Valley Operations Into a Single Facility Designed for Increased Efficiency and Low Environmental Impact

Booth to Feature Complete Portfolio of Testers, Probe Cards and Handlers

Module-s Ability to Test All Variations of Clock Requirements Enables Greater Test Coverage in a Single System

New Methodology With Industry-s Highest Parallelism Being Used in Volume Production to Lower Cost of Testing RFID ICs

CUPERTINO, CA — (Marketwire) — 01/19/12 — Semiconductor test equipment supplier Verigy, an Advantest Group company (TSE: 6857) (NYSE: ATE), will feature a keynote presentation at VOICE 2012 by Mitch Ditkoff, an author, blogger and management consultant. A frequent keynote and large group workshop facilitator, Ditkoff has been an adjunct faculty member for several esteemed leadership development programs, including GE-s Crotonville Management Development Center and Duke Corporate Education.