Media Alert: Advantest to Exhibit at SEMICON Europa 2014 in Grenoble, France October 7-9
Showcasing Solutions for E-Beam Lithography and CD-SEM Metrology, as Well as New Non-Destructive Terahertz Imaging Systems
Advantest Introduces High-Performance Test Handler for SoC Devices, Offering Industry-Leading Productivity and Flexibility
New M4871 Combines Production-Proven Capabilities of Company-s Existing Handlers With Functions Needed for Testing Advanced SoCs
Advantest Introduces New Image-Processing Unit for Testing Advanced CMOS Image Sensors on Industry-Leading T2000 Platform
New T2000 ISS IPE2 Unit Uses Greater Image-Processing Power to Achieve Higher Throughput and Lower Cost of Test
Advantest Announces New 64-Channel, General Purpose VI Module on T2000 Platform for Low-Cost Testing of High-Density, Multi-Function Power Management, Automotive ICs
New T2000 GVI64 Module Performs Highly Parallel Testing of ICs for Power-Management and Automotive Applications
Advantest Earns Its First Ranking on List of U.S. Environmental Protection Agency-s Top Tech and Telecom Partners
World-s Largest Semiconductor Test Equipment Supplier Recognized for Its Use of Green Power
Advantest Issues Call for Papers for VOICE 2014 Technical Program
Advantest Developer Conference Expands to Two Locations in May 2014: Silicon Valley, California and Austin, Texas
Advantest-s V93000 Smart Scale Selected as Primary Test System by HiSilicon Technologies in Shenzhen, China
ASIC Maker Will Use Advantest-s Tester in Engineering and Production of All Its Semiconductor Products
Advantest Earns Best Supplier Award From STATS ChipPAC
World-s Top Supplier of Automatic Semiconductor Test Equipment Recognized for Sixth Consecutive Year
Advantest-s V93000 Dragon System Selected as Main Test Platform by SHHIC, Leading RFID IC Manufacturer in China
Installation Marks the First Use of an Advantest V93000 Dragon System in Highly Parallel RFID Device Testing
Advantest Enters Protocol-Based Flash Storage Market With New Versatile Test Platform
Company-s Years of Engineering Development Work Yield Flexible Test Solution for All Next-Generation SSDs