Advantest Introduces New Universal Analog Pin Module to Extend V93000 Platform–s Capabilities for Smart Testing of Smart Devices
New AVI64 Module Designed for Efficient Testing of Highly Integrated SoCs for IoT, Mobile and Automotive Markets
Media Alert: Advantest to Showcase Its Newest IC Memory Testers and Measurement Systems at the SEMICON Korea Trade Show, January 27-29 in Seoul
A Variety of New-to-Market Systems Will Be on Display in the Booth
Advantest Opens Registration for VOICE 2016 Developer Conference in the U.S. and Taiwan
Semiconductor Test Conference Marks 10th Anniversary With Two Events, Including Its First-Ever in Taiwan
Media Alert: Advantest Will Be Exhibitor, Paper Presenter and Gold Sponsor at SEMICON Japan Trade Show, December 16-18 in Tokyo
World–s Largest ATE Supplier Will Have a Major Presence at This Month–s Semiconductor Industry Event
Advantest Launches EVA100 Digital Solution, Extending the Product Family–s Capabilities to Include Digital ICs
New System–s Scalable Architecture Contributes to More Efficient Testing of Semiconductors Used in IoT Devices
Advantest Provides Simultaneous Measurement Solution on Its T2000 Tester With New RECT550EX HIFIX Unit
TOKYO, JAPAN — (Marketwired) — 12/09/15 — Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) has announced a new RECT550EX HIFIX (High-Fidelity Test Access Fixture) unit to enhance the capabilities of its T2000 system-on-chip (SoC) test platform in performing highly parallel testing. The RECT550EX HIFIX has 50 percent more application space and is capable of handling 30 percent more channels than the previous RECT550 HIFIX model, enabling highly paral
Advantest–s New High-Speed T5851 Semiconductor Memory Tester Provides Versatile, Low-Cost Solution
Tester Enables System-Level Testing of High-Performance Universal Flash Storage and PCIe BGA SSDs for the Rapidly Growing Mobile Electronics Market
Media Alert: Advantest to Feature New EVA100 Production Model at Productronica in Munich, Germany, 10-13 November
Stand Exhibits Highlight the Volume Production of Sensors, Analog and Mixed-Signal ICs
Advantest Introduces Production Model of Its EVA100 Measurement System for Sensors, Analog and Mixed-Signal ICs
New EVA100 Production Model Offers Versatile, Easy-to-Use Test Solution for Applications From Design Evaluation to Volume Production
Call for Papers Issued for Advantest–s VOICE 2016 Developer Conference on the Newest Semiconductor Test Technologies
Tenth Annual International Test Conference to Be Held in Both the U.S. and Taiwan, Featuring Technical Sessions and Networking Opportunities