Advantest Introduces New Image-Processing Unit for Testing Advanced CMOS Image Sensors on Industry-Leading T2000 Platform
New T2000 ISS IPE2 Unit Uses Greater Image-Processing Power to Achieve Higher Throughput and Lower Cost of Test
Advantest Earns Its First Ranking on List of U.S. Environmental Protection Agency-s Top Tech and Telecom Partners
World-s Largest Semiconductor Test Equipment Supplier Recognized for Its Use of Green Power
Advantest Issues Call for Papers for VOICE 2014 Technical Program
Advantest Developer Conference Expands to Two Locations in May 2014: Silicon Valley, California and Austin, Texas
Advantest Earns Best Supplier Award From STATS ChipPAC
World-s Top Supplier of Automatic Semiconductor Test Equipment Recognized for Sixth Consecutive Year
Advantest-s V93000 Smart Scale Selected as Primary Test System by HiSilicon Technologies in Shenzhen, China
ASIC Maker Will Use Advantest-s Tester in Engineering and Production of All Its Semiconductor Products
Advantest-s V93000 Dragon System Selected as Main Test Platform by SHHIC, Leading RFID IC Manufacturer in China
Installation Marks the First Use of an Advantest V93000 Dragon System in Highly Parallel RFID Device Testing
Advantest Enters Protocol-Based Flash Storage Market With New Versatile Test Platform
Company-s Years of Engineering Development Work Yield Flexible Test Solution for All Next-Generation SSDs
Advantest Introduces New V93000 Mobile PMIC Solution Designed for Cost-Efficient, Massively Parallel Testing of PMICs and Other SoC Semiconductors
TOKYO — (Marketwired) — 07/08/13 — Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) has entered the market for testing system-on-chip (SoC) mobile power-management ICs (PMIC) by delivering the semiconductor industry-s most cost-compelling solution using the V93000 platform. Compatible with Advantest-s large global installed base of V93000 systems, the new solution has the flexibility to perform massive multi-site testing of complex SoC devices and s
Advantest Now Delivering New T5831 System for Testing NAND Flash and NAND-Based MCPs Used in Mobile Electronics
New Tester Combines High Productivity With Low Cost of Test in Modular, Extendible System Design
Advantest and Galaxy Partner to Improve OEE With New Test Floor Intelligence Software Solutions
Partnership to Develop and Market Systems That Optimize Test-Floor Operations for Greater Cost Efficiency