New IEEE 1149.1-2012 JTAG Standard, Supporting Re-Usable IC Test Structures, Passes Ballot
ANAHEIM, CA — (Marketwire) — 11/07/12 — ITC – International Test Conference — Intellitech Corporation announced today that the proposed IEEE 1149.1-2012 JTAG standard has reached consensus with an eighty-five percent approval in a recent IEEE ballot. The standard incorporates industry best practices for enabling IC test re-use from silicon to systems. Structural and procedural description languages have been standardized to support re-use of on-chip infrastructure IP blocks such as MemoryBI