Advantest Earns Supplier Excellence Award From Texas Instruments
TI Using Advantest-s M4841 Pick-and-Place Handlers With Its Automated Test Equipment
Advantest Installs Multiple V93000 Dragon Testers at Powertech Technology Inc., a Leading Taiwanese Test and Assembly Foundry
New Dragon Testers Selected for Their Ability to Achieve Lowest Cost of Test for a Variety of SOC Devices
Advantest Enters MEMS Testing Market With Multiple System Installations at Freescale(R) Semiconductor-s Facilities in Arizona and Asia
V93000 Smart Scale(TM) Testers With Small A-Class Test Heads and Pin Scale 1600 Cards Qualified for High-Volume, Low-Cost Testing of MEMS-Based Sensors
Advantest to Feature Keynote Address by Futurist, Glen Hiemstra, at VOICE 2013 User-s Group and Partners Conference
TOKYO — (Marketwire) — 03/26/13 — VOICE 2013, a user-s group meeting and partners conference organized by Advantest Corporation (TSE: 6857) (NYSE: ATE), will feature a keynote presentation by Glen Hiemstra, founder of Futurist.com. An internationally acclaimed expert on long-range trends and creating the preferred future, Hiemstra has advised professional, business, and governmental organizations for two decades and served as a technical advisor for futuristic television programs. He is the
Advantest VOICE 2013 Conference to Feature High Quality Presentations for SOC Platforms and Handlers
Registration Open for April 23-25 Conference in San Jose
Advantest-s New Test Cell Selected by Marvell Semiconductor to Reduce Cost of Test for High-Volume, Cost-Sensitive ICs
Based on Evaluation Unit-s High Performance, the x16 Parallel Test Cell Has Been Released for Production for Marvell Products
Advantest Announces VOICE 2013 User-s Conference for System-on-Chip and Memory Semiconductor Devices and Handler Test Technologies
Seventh Annual VOICE Conference Includes Fully Integrated Tracks Featuring Advantest-s T2000, V93000 and Memory Test Platforms
Advantest Introduces New T2000 3Gbps CMOS Image Capture Module for Industry-Leading T2000 ISS Semiconductor Test Platform
High-Speed Image Capturing and Highly Parallel Testing Help to Reduce Production Costs for CMOS Image Sensing Devices
Advantest Introduces T2000 8Gbps Digital Module for High-Speed Testing of SoCs With Serial, Parallel or Memory Interfaces
Versatile New Test Instrument Reduces Costs and Speeds Time to Market for New ICs
Advantest Introduces T2000 IMS for Low-Cost Testing of Integrated Microcontroller and Smart Card ICs
Company-s Universal Pin Architecture Enables Massively Parallel Testing in a Single System