Advantest Joins With Malaysian OSAT Fabtronic and Government Group to Establish First Shared-Services Lab in Southeast Asia
Region–s Semiconductor Test Engineers to Train and Develop Professional Skills on Advantest–s Industry-leading Test Solutions
Advantest Introduces New Channel Card Providing a Quantum Leap in Testing of High-Speed Memory Semiconductors on Proven V93000 Platform
New HSM16G Card Designed for Fully Integrated Testing of the Current and Upcoming Generation of DRAM Memory ICs With Data Rates up to 16 Gbps
Advantest Partners With USI to Bring Subcontracted Testing Services to SSD Storage Market
Advantest–s MPT3000 System With Comprehensive Multi-Protocol Capability Enables USI to Create New OSAT Business Dedicated to SSD Testing
Media Alert – Advantest to Exhibit at the Intel Developer Forum, August 18-20 in San Francisco
Company–s Test Solutions for All Types of Memory ICs Enable Cost-Efficient Chip Production for IoT, Wearable Electronics and More
Advantest to Highlight Solid State Drive Test Solutions at Flash Memory Summit, August 11-13 in Silicon Valley
Booth Exhibits and Paper Presentation Address SSD Testing From Engineering to Volume-Production Environments
Advantest–s MPT3000 Platform Becomes the Storage Industry–s Most Flexible and Extendible Test Solution for SSDs
MPT3000 System–s Capabilities in SSD Testing Expanded With Downloadable Firmware to Support Additional Protocols
Advantest to Exhibit Wide Range of Semiconductor Test Solutions for the Internet of Things (IoT) at SEMICON West, July 14-16 in San Francisco
Displays Will Range From Newest Semiconductor Test Equipment to Novel Tester for Internet-Connected Retail Electronics
Advantest Holds VOICE 2015 Developer Conference on Two Continents for the First Time and Attracts Over 400 Attendees
More Than 100 Technical Presentations and Numerous Networking Opportunities Distinguish Annual Semiconductor Test Forum
Advantest Launches Versatile T5833 Memory Test System
New, Multifunctional Test System Supports Both Mobile DRAM and NAND Flash Memory
Advantest Launches Its First Integrated Test Solution for Optical Transceivers That Drive the Growing Markets for Data Centers and Networks
New T2000 28G OPM Parallel-Testing Module Combines High-Speed Performance With Low Cost of Test